Localization effect of a current-path in amorphous...

Thin Solid Films 2011 Vol. 519; Iss. 13

Localization effect of a current-path in amorphous In–Ga–Zn–O thin film transistors with a highly doped buried-layer

Eugene Chong, Yong Woo Jeon, Yoon Soo Chun, Dae Hwan Kim, Sang Yeol Lee
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Volume:
519
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2011.02.033
File:
PDF, 560 KB
english, 2011
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