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Ellipsometric study of thermally induced redistribution and crystallization of Ge in Ge:SiO2 mixture layers
Vesna Janicki, Jordi Sancho-Parramon, Hrvoje Zorc, Krešimir Salamon, Maja Buljan, Nikola Radić, Uroš DesnicaVolume:
519
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2011.02.071
File:
PDF, 732 KB
english, 2011