Interpretation of the two-components observed in high resolution X-ray diffraction ω scan peaks for mosaic ZnO thin films grown on c-sapphire substrates using pulsed laser deposition
O. Durand, A. Letoublon, D.J. Rogers, F. Hosseini TeheraniVolume:
519
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2011.04.036
File:
PDF, 612 KB
english, 2011