Improvement of bias stability of indium zinc oxide thin film transistors by the incorporation of hafnium fabricated by radio-frequency magnetron sputtering
Eugene Chong, Yoon Soo Chun, Seung Han Kim, Sang Yeol LeeVolume:
519
Year:
2011
Language:
english
Pages:
3
DOI:
10.1016/j.tsf.2011.04.044
File:
PDF, 338 KB
english, 2011