Capacitance–voltage characterization of silicon oxide and silicon nitride coatings as passivation layers for crystalline silicon solar cells and investigation of their stability against x-radiation
Jan Martin Kopfer, Sinje Keipert-Colberg, Dietmar BorchertVolume:
519
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2011.04.107
File:
PDF, 769 KB
english, 2011