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Amorphous-to-Crystalline Transformation of Thin ITO Films Studied by In-Situ Grazing Incidence X-Ray Diffractometry
Quaas, M., Wulff, Harm, Steffen, H., Hippler, R.Volume:
378-381
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.378-381.320
File:
PDF, 334 KB
2001