Nondestructive three-dimensional characterization of grain boundaries by X-ray crystal microscopy
Wenjun Liu, Gene E. Ice, Bennett C. Larson, Wenge Yang, Jonathan Z. TischlerVolume:
103
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.ultramic.2004.11.022
File:
PDF, 560 KB
english, 2005