Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential
S.F. Lyuksyutov, P.B. Paramonov, O.V. Mayevska, M.A. Reagan, E. Sancaktar, R.A. Vaia, S. JuhlVolume:
106
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.ultramic.2006.04.002
File:
PDF, 216 KB
english, 2006