Static-charging mitigation and contamination avoidance by...

Ultramicroscopy 2006 Vol. 106; Iss. 11-12

Static-charging mitigation and contamination avoidance by selective carbon coating of TEM samples

Thomas Höche, Jürgen W. Gerlach, Tino Petsch
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Volume:
106
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.ultramic.2006.05.007
File:
PDF, 181 KB
english, 2006
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