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STEM nanodiffraction technique for structural analysis of CoPt nanoparticles
D. Alloyeau, C. Ricolleau, T. Oikawa, C. Langlois, Y. Le Bouar, A. LoiseauVolume:
108
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.ultramic.2007.10.006
File:
PDF, 811 KB
english, 2008