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Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopy
K. Mitsuishi, K. Iakoubovskii, M. Takeguchi, M. Shimojo, A. Hashimoto, K. FuruyaVolume:
108
Year:
2008
Language:
english
Pages:
8
DOI:
10.1016/j.ultramic.2008.04.005
File:
PDF, 691 KB
english, 2008