Electrostatic force microscopy measurements of charge...

Ultramicroscopy 2008 Vol. 108; Iss. 10

Electrostatic force microscopy measurements of charge trapping behavior of Au nanoparticles embedded in metal–insulator–semiconductor structure

JungYup Yang, JooHyung Kim, JunSeok Lee, SeungKi Min, HyunJung Kim, Kang L. Wang, JinPyo Hong
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
108
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.ultramic.2008.04.041
File:
PDF, 2.20 MB
english, 2008
Conversion to is in progress
Conversion to is failed