MFM studies of interlayer exchange coupling in Co/Ru/Co films: Effect of Ru layer thickness
Lanping Yue, Zhen Li, Roger Kirby, David SellmyerVolume:
109
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.ultramic.2009.03.037
File:
PDF, 392 KB
english, 2009