Microelectrical characterizations of junctions in solar cell devices by scanning Kelvin probe force microscopy
C.-S. Jiang, A. Ptak, B. Yan, H.R. Moutinho, J.V. Li, M.M. Al-JassimVolume:
109
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.ultramic.2009.03.048
File:
PDF, 379 KB
english, 2009