Modeling a radio-frequency single-electron-transistor scanning probe
Lü, Li, Su, Lina, Sun, Jiandong, Li, Xinxing, Qin, Hua, Ji, Zhongqing, Blick, Robert H.Volume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.085001
Date:
August, 2014
File:
PDF, 1.31 MB
english, 2014