Boron-Induced Strain Relaxation in Hydrogen-Implanted...

Boron-Induced Strain Relaxation in Hydrogen-Implanted SiGe/Si Heterostructures

Lee, Sheng-Wei, Chueh, Chi-An, Chang, Hung-Tai
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Volume:
156
Year:
2009
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.3236680
File:
PDF, 662 KB
english, 2009
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