Gentle STEM: ADF imaging and EELS at low primary energies

Ultramicroscopy 2010 Vol. 110; Iss. 8

Gentle STEM: ADF imaging and EELS at low primary energies

Ondrej L. Krivanek, Niklas Dellby, Matthew F. Murfitt, Matthew F. Chisholm, Timothy J. Pennycook, Kazutomo Suenaga, Valeria Nicolosi
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Volume:
110
Year:
2010
Language:
english
Pages:
11
DOI:
10.1016/j.ultramic.2010.02.007
File:
PDF, 1.25 MB
english, 2010
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