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Combining moiré patterns and high resolution transmission electron microscopy for in-plane thin films thickness determination
M. Valamanesh, C. Langlois, D. Alloyeau, E. Lacaze, C. RicolleauVolume:
111
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.ultramic.2010.10.017
File:
PDF, 915 KB
english, 2011