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Effect of atmosphere on reliability of passivated 0.15 [micro sign]m InAlAs/InGaAs HEMTs
Dammann, M., Chertouk, M., Jantz, W., Köhler, K., Schmidt, K.H., Weimann, G.Volume:
34
Year:
1998
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19981383
File:
PDF, 398 KB
english, 1998