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[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Role of the Ionicity in Defect Formation in Hf-Based Dielectrics
Umezawa, Naoto, Shiraishi, Kenji, Miyazaki, Seiichi, Uedono, Akira, Akasaka, Yasushi, Inumiya, Seiji, Oshiyama, Atsushi, Hasunuma, Ryu, Yamabe, Kikuo, Momida, Hiroyoshi, Ohno, Takahisa, Ohmori, Kenji,Volume:
11
Year:
2007
Language:
english
DOI:
10.1149/1.2779561
File:
PDF, 328 KB
english, 2007