Tantalum and Tungsten in Silicon Carbide: Identification and Polytype Dependence of Deep Levels
Grillenberger, Joachim, Achtziger, N., Pasold, G., Sielemann, R., Witthuhn, W.Volume:
353-356
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.353-356.475
File:
PDF, 361 KB
2001