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[ECS 208th ECS Meeting - Los Angeles, California (October 16-October 21, 2005)] ECS Transactions - Charge Capture Kinetics of Nitride Trap in Oxide-Nitride-Oxide Structures
Cho, Hoon Young, Park, Chan Jin, Oh, Hyung Taek, Kwak, Dong Wook, Lee, Youn Hwan, Yang, Woo Choel, Kim, Chung WooVolume:
1
Year:
2006
Language:
english
DOI:
10.1149/1.2209314
File:
PDF, 534 KB
english, 2006