Local analysis of semiconductor nanoobjects by scanning...

St. Petersburg Polytechnical University Journal: Physics and Mathematics 2015 / 03 Vol. 1; Iss. 1

Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy

Lashkova, Natalia A., Permiakov, Nikita V., Maximov, Alexander I., Spivak, Yulia M., Moshnikov, Vyacheslav A.
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Volume:
1
Language:
english
Journal:
St. Petersburg Polytechnical University Journal: Physics and Mathematics
DOI:
10.1016/j.spjpm.2015.03.014
Date:
March, 2015
File:
PDF, 1.48 MB
english, 2015
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