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A data-driven two-stage maintenance framework for...

A data-driven two-stage maintenance framework for degradation prediction in semiconductor manufacturing industries

Luo, Ming, Yan, Heng-Chao, Hu, Bin, Zhou, Jun-Hong, Pang, Chee Khiang
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Volume:
85
Language:
english
Journal:
Computers & Industrial Engineering
DOI:
10.1016/j.cie.2015.04.008
Date:
July, 2015
File:
PDF, 2.80 MB
english, 2015
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