[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Influence of Layout Parameters on Triggering Behavior in 0.35um and 0.18um Process gg-nMOS ESD Protection Devices
Litzenberger, M., Pichler, R., Pogany, D., Gornik, E., Esmark, K., Gossner, H.Year:
2001
DOI:
10.1109/ESSDERC.2001.195269
File:
PDF, 250 KB
2001