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Low-Cost Condition Monitoring System of Rotating Machinery Based on LabVIEW
Fan, Ya Jun, Guo, Yu, Wu, Chuan HuiVolume:
474-476
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.474-476.735
Date:
April, 2011
File:
PDF, 251 KB
english, 2011