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[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Strain Degradation in Strained-Si Layers Far Thicker than the Critical Thickness Grown on Relaxed Si
Kang, Suk June, Yuk, Hyung-Sang, Kim, In-Kyum, Lee, Jea-Chun, Lee, Sang-Hyun, Shim, Jung-Jin, Lee, Bo-Young, Fiorenza, J. G., Curtin, M., Lochtefeld, AnthonyVolume:
3
Year:
2006
Language:
english
DOI:
10.1149/1.2355838
File:
PDF, 748 KB
english, 2006