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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Hard X-Ray and Gamma-Ray Detector Physics and Applications - Structural defects and impurities on CZT crystals
Hermon, Haim, Hackett, Colin, Tarver, Ed, Cross, Eilene S., Yang, Nancy, James, Ralph B., Schieber, Michael M., Komar, Vitaliy K., Kolesnikov, Nikolai N., Doty, F. P., Hoover, Richard B.Volume:
3446
Year:
1998
Language:
english
DOI:
10.1117/12.312903
File:
PDF, 2.46 MB
english, 1998