SPIE Proceedings [SPIE Photonics, Devices, and Systems II -...

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SPIE Proceedings [SPIE Photonics, Devices, and Systems II - Prague, Czech Republic (Sunday 26 May 2002)] Photonics, Devices, and Systems II - Image quality influenced by selected image-sensor parameters

Vitek, Stanislav, Hozman, Jiri, Hrabovsky, Miroslav, Senderakova, Dagmar, Tomanek, Pavel
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Volume:
5036
Year:
2003
Language:
english
DOI:
10.1117/12.498235
File:
PDF, 350 KB
english, 2003
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