Comparison of back-foil SXRF and EPMA for the elemental...

Vacuum 2005 Vol. 77; Iss. 4

Comparison of back-foil SXRF and EPMA for the elemental characterization of thin coatings

E.S. Valamontes, J.C. Statharas
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Volume:
77
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.vacuum.2004.11.002
File:
PDF, 295 KB
english, 2005
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