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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Dispersion free all reflective confocal microscope objective
Walecki, Wojtek J., Scaggs, Mike, Walecki, Peter S., Szondy, Fanny, Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C., Maugel, Tim K.Volume:
8036
Year:
2011
Language:
english
DOI:
10.1117/12.883385
File:
PDF, 120 KB
english, 2011