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Radiation-induced defects in MOS structures after irradiation with high-energy Ar, Kr, Bi heavy ions
J. Stan˘o, V.A. Skuratov, M. Žis˘ka, P. KováčVolume:
78
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.vacuum.2005.01.098
File:
PDF, 266 KB
english, 2005