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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Study on fruit quality measurement and evaluation based on color identification
Wang, Yizhong, Cui, Yanhua, Chen, Shaohui, Zhang, Ping, Huang, Huafang, Huang, George Q., Yoshizawa, Toru, Wei, Ping, Zheng, JesseVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.839698
File:
PDF, 1.11 MB
english, 2009