Utilization of wet chemical etching for revealing defects in GaAs X-ray detector arrays
J. Škriniarová, A. Perd’ochová, M. Hrúzik, M. Veselý, B. Bendjus, L. Haupt, I. Besse, M. HermsVolume:
80
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.vacuum.2005.08.003
File:
PDF, 330 KB
english, 2005