Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD)
Yang, Bo, Li, Zong Bin, Zhang, Yu Dong, Esling, Claude, Qin, Gao Wu, Zhao, Xiang, Zuo, LiangVolume:
783-786
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.783-786.2561
Date:
May, 2014
File:
PDF, 5.09 MB
english, 2014