Structural damage studies in conducting indium-tin oxide...

Structural damage studies in conducting indium-tin oxide (ITO) thin films induced by Au8+ swift heavy ions (SHI) irradiation

N.G. Deshpande, A.A. Sagade, S.D. Chavhan, J.C. Vyas, F. Singh, A.K. Tripathi, D.K. Avasthi, Ramphal Sharma
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Volume:
82
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.vacuum.2007.03.004
File:
PDF, 587 KB
english, 2007
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