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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Oxide-based Materials and Devices IV - Dopant profiles in heavily doped ZnO
Claflin, B., Leedy, K. D., Look, D. C., Teherani, Ferechteh Hosseini, Look, David C., Rogers, David J.Volume:
8626
Year:
2013
Language:
english
DOI:
10.1117/12.2009394
File:
PDF, 646 KB
english, 2013