Silver endotaxy in silicon under various ambient conditions and their use as surface enhanced Raman spectroscopy substrates
Juluri, R.R., Ghosh, A., Bhukta, A., Sathyavathi, R., Satyam, P.V.Volume:
586
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2015.02.079
Date:
July, 2015
File:
PDF, 1.30 MB
english, 2015