Investigation of light element contents in subsurface...

Investigation of light element contents in subsurface layers of silicon

A.P. Kobzev, J. Huran, D. Maczka, M. Turek
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Volume:
83
Year:
2009
Language:
english
Pages:
1
DOI:
10.1016/j.vacuum.2009.01.042
File:
PDF, 290 KB
english, 2009
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