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Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies
A. Bozanic, Z. Majlinger, M. Petravic, Q. Gao, D. Llewellyn, C. Crotti, Y.-W. Yang, K.-J. Kim, B. KimVolume:
84
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.vacuum.2009.04.020
File:
PDF, 358 KB
english, 2009