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Analysis of Co/Cu multilayers by SNMS reverse depth profiling
A. Csik, K. Vad, G.A. Langer, G.L. Katona, E. Tóth-Kádár, L. PéterVolume:
84
Year:
2009
Language:
english
Pages:
3
DOI:
10.1016/j.vacuum.2009.04.066
File:
PDF, 152 KB
english, 2009