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SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Machine Vision Applications in Industrial Inspection IV - Automatic leather inspection of defective patterns
Tafuri, Maria, Branca, Antonella, Attolico, Giovanni, Distante, Arcangelo, Delaney, William, Rao, A. Ravishankar, Chang, NingVolume:
2665
Year:
1996
Language:
english
DOI:
10.1117/12.232232
File:
PDF, 1.22 MB
english, 1996