High-sensitivity and high-resolution low-energy ion...

Vacuum 2010 Vol. 84; Iss. 8

High-sensitivity and high-resolution low-energy ion scattering

Hidde H. Brongersma, Thomas Grehl, Paul A. van Hal, Niels C.W. Kuijpers, Simon G.J. Mathijssen, Emma R. Schofield, Richard A.P. Smith, Hendrik R.J. ter Veen
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Volume:
84
Year:
2010
Language:
english
Pages:
3
DOI:
10.1016/j.vacuum.2009.11.016
File:
PDF, 376 KB
english, 2010
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