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SPIE Proceedings [SPIE Photonics Fabrication Europe - Brugge, Belgium (Monday 28 October 2002)] Laser Diodes, Optoelectronic Devices, and Heterogenous Integration - Improved beam quality due to current profiling in a broad-area semiconductor laser
Houlihan, John A., Voignier, Vincent, O'Callaghan, James R., Wu, Guanhong, Huyet, Guillaume, McInerney, John G., Corbett, Brian, Driessen, Alfred, Baets, Roel G., McInerney, John G., Suhir, EphraimVolume:
4947
Year:
2003
Language:
english
DOI:
10.1117/12.476265
File:
PDF, 272 KB
english, 2003