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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Stereoscopic Displays and Applications XXVI - An objective method for 3D quality prediction using visual annoyance and acceptability level
Holliman, Nicolas S., Woods, Andrew J., Favalora, Gregg E., Kawai, Takashi, Khaustova, Darya, Fournier, Jérôme, Wyckens, Emmanuel, Le Meur, OlivierVolume:
9391
Year:
2015
Language:
english
DOI:
10.1117/12.2076949
File:
PDF, 1.66 MB
english, 2015