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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers - Manufacture, Structure And Performance Of W/B4C Multilayer X-Ray Mirrors
Jankowski, A. F., Makowiecki, D. M., Christensen, Finn E.Volume:
984
Year:
1988
Language:
english
DOI:
10.1117/12.948771
File:
PDF, 6.79 MB
english, 1988