Statistical approach to unsupervised defect detection and...

Optical Engineering 2008 / 02 Vol. 47; Iss. 2

Statistical approach to unsupervised defect detection and multiscale localization in two-texture images

Gururajan, Arunkumar
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Volume:
47
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.2868783
Date:
February, 2008
File:
PDF, 590 KB
english, 2008
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