SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Polarization errors suppression in distributed perturbation sensor based on Dual Mach-Zehnder interferometer
Ding, Zhenyang, Liu, Tiegen, Liu, Kun, Jiang, Junfeng, Liu, Jing, Chen, QinnanVolume:
8201
Year:
2012
Language:
english
DOI:
10.1117/12.905339
File:
PDF, 271 KB
english, 2012