Photo-Acoustic Displacement Measurements for...

Photo-Acoustic Displacement Measurements for Characterization of Subsurface Defects in Silicon

Sumie, Shingo, Takamatsu, Hiroyuki, Nishino, Taneo
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Volume:
115-116
Year:
1994
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.115-116.85
File:
PDF, 1.13 MB
english, 1994
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