[IEEE 2015 28th International Conference on VLSI Design (VLSID) - Bangalore, India (2015.1.3-2015.1.7)] 2015 28th International Conference on VLSI Design - Reliability Enhancement of SoCs Based on Dynamic Memory Access Profiling in Conjunction with PVT Monitoring
Baranwal, Deepak, Singh, Digvijay, Soyeb, Khanusiya, Rout, Sidhartha Sankar, Deb, SujayYear:
2015
Language:
english
DOI:
10.1109/VLSID.2015.97
File:
PDF, 556 KB
english, 2015